Cadence Design Systems Inc. has announced Cadence Encounter Diagnostics, reportedly the industry?s first yield diagnostics tool.
 Encounter Diagnostics accelerates yield by identifying customers? most critical nanometer IC yield issues and precisely locating root cause defects. The result is higher yield in less time. The tool supports all digital design styles and test vectors produced by all popular ATPG tools. The tool includes static and dynamic diagnostics, patented pattern fault modeling, and support of all industry standard test vectors.
www.cadence.com
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